Materials Engineering Department faculty specialize in complementary research areas: development of polymers designed for sustainability, product design using ceramics, energy storage of batteries and supercapacitors, improvement of learning through visual representation, computation modeling and simulation, application of conductive composites and additive manufacturing.
Modified from mate.calpoly.edu
Submissions from 1996
Assessment of the Compositional Influences on the Toughness of TiCr2-Base Laves Phase Alloys, Katherine C. Chen, Samuel M. Allen, and James D. Livingston
Submissions from 1995
Evidence of Heterogeneous Substructure Development During Primary Creep of Ti-6Al-2Sn-4Zr-2Mo, R. W. Hayes, Cecil Rhodes, and Blair London
Submissions from 1992
Morphology, Deformation, and Defect Structures of TiCr2 in Ti-Cr Alloys, Katherine C. Chen, Samuel M. Allen, and James D. Livingston
On the Creep Deformation of a Cast Near Gamma TiAl Alloy Ti-48Al-1Nb, R. W. Hayes and B. London
Application of Optical Emission Diagnostics and Control Related to Semiconductor Processing, Richard N. Savage and Greg C. Viloria
Steady-State Creep Deformation of Investment Cast Near-Gamma Titanium Aluminide, D. A. Wheeler, B. London, and D. E. Larsen Jr.
Submissions from 1991
Apparatus and Method for Automatically Identifying Chemical Species Within a Plasma Reactor Environment, Richard N. Savage
In-Situ Film Thickness Measurements for Real-Time Monitoring and Control of Advanced Photoresist Track Coating Systems, Richard N. Savage, Thomas E. Metz, and Horace O. Simmons
Submissions from 1990
Optical Switch, Richard N. Savage
In-Line Photoresist Thickness Monitor, Richard N. Savage, Tom W. Batchelder, Kenneth M. Sautter, and Gary H. Memovich
Real-Time, In-Situ Measurement of Film Thickness and Uniformity During Plasma Ashing of Photoresist, Richard N. Savage, Horace Simmons, John T. Davies, and Thomas Metz
Submissions from 1985
New Specimen Design for Studying the Growth of Small Fatigue Cracks with Surface Acoustic Waves, Blair London
Applications of Optical Emission Spectroscopy to Semiconductor Processing, Richard N. Savage, John G. Shabushnig, and Paul R. Demko
Submissions from 1982
Metal Cation/Anion Speciation Via Paired-Ion, Reversed Phase HPLC With Refractive Index and/or Inductively Coupled Plasma Emission Spectroscopic Detection Methods, Richard N. Savage; D. Bushee; I. S. Krull; and S. B. Smith, Jr.
Speciation of Cr (III) and Cr (VI) Via Reversed Phase HPLC With Inductively Coupled Plasma Emission Spectroscopic Detection (HPLC-ICP)24, Richard N. Savage; I. S. Krull; D. Bushee; R. G. Schleicher; and S. B. Smith, Jr.
Submissions from 1981
Characteristics of the Background Emission Spectrum From a Miniature Inductively-Coupled Plasma, Richard N. Savage and G. M. Hieftje
Development and Characterization of a 9-mm Inductively-Coupled Argon Plasma Source for Atomic Emission Spectrometry, A. D. Weiss, Richard N. Savage, and G. M. Hieftje
Submissions from 1978
Enhancement of Pneumatic Nebulization Efficiency Through Application of an Electric Field, Richard N. Savage and G. M. Hieftje