Submissions from 2004
Does Academic Dishonesty Relate to Unethical Behavior in Professional Practice? An Exploratory Study, Trevor S. Harding, Donald D. Carpenter, Cynthia J. Finelli, and Honor J. Passow
The Influence of Academic Dishonesty on Ethical Decision- Making in the Workplace: A Study of Engineering Students, Trevor S. Harding, Donald D. Carpenter, Cynthia J. Finelli, and Honor J. Passow
Investigation of Subcritical Fatigue Crack Growth in Gamma Titanium Aluminides, Blair London
Work in Progress – Classical Ballet Structure and Practice Applied to Engineering Class Sessions, Blair London and Lisa Deyo
Teaching Corporate Culture: An Engineer's Survival Guide, Richard N. Savage
Submissions from 2003
How We Learned to Love the Phase Diagram with a Ti-Cr Alloy Characterization Lab, Katherine C. Chen
NiTi - Magic or Phase Transformation?, Katherine C. Chen
Physical Metallurgy: Providing Unifying Principles in Diverse Areas of Materials Engineering, Katherine C. Chen and Vilupanur A. Ravi
Students' Perceptions of Both the Certainty and the Deterrent Effect of Potential Consequences of Cheating, Cynthia J. Finelli, Trevor S. Harding, Donald D. Carpenter, and Honor J. Passow
An Examination of the Relationship Between Academic Dishonesty and Professional Behavior, Trevor S. Harding, Honor J. Passow, Donald D. Carpenter, and Cynthia J. Finelli
Formation and Growth of Intermetallics around Metallic Particles in Eutectic Sn-Ag Solder, J. G. Lee, Katherine C. Chen, and K. N. Subrmanian
Structural and Diffusional Effects of Hydrogen in TiNi, Alan R. Pelton, Christine Trépanier, Xiao-Yan Gong, Andreas Wick, and Katherine C. Chen
Effects of Intermetallic Morphology at the Metallic Particle/Solder Interface on Mechanical Properties of Sn-Ag-Based Solder Joints, H. Rhee, F. Guo, J. G. Lee, Katherine C. Chen, and K. N. Subramanian
Semiconductor Wafer Processing System With Vertically-Stacked Process Chambers and Single-Axis Dual-Wafer Transfer System, Richard N. Savage, Frank S. Menagh, Helder R. Carvalheira, Philip A. Troiani, Dan L. Cossentine, Eric R. Vaughan, and Bruce E. Mayer
Submissions from 2002
P.A.C.E.S. - A Study on Academic Integrity Among Engineering Undergraduates (Preliminary Conclusions), Donald D. Carpenter, Trevor S. Harding, Susan M. Montgomery, and Nicholas H. Steneck
Student Perceptions of Institutional and Instructor Based Techniques for Dealing with Academic Dishonesty, Donald D. Carpenter, Trevor S. Harding, Susan M. Montgomery, Nicholas H. Steneck, and Eric Dey
Damage Accumulation Under Repeated Reverse Stressing of Sn-Ag Solder Joints, Katherine C. Chen, A. Telang, J. G. Lee, and K. N. Subramanian
Phase Changes in Ni-Ti Under Laser Shock Loading, R. E. Hackenberg, D. C. Swift, J. C. Cooley, Katherine C. Chen, D. J. Thoma, D. L. Paisley, and A. Hauer
A Comparison of the Role of Academic Dishonesty Policies of Several Colleges on the Cheating Behavior of Engineering and Pre-Engineering Students, Trevor S. Harding, Donald D. Carpenter, Susan M. Montgomery, and Nicholas H. Steneck
Suggestions for Establishing Centers for Engineering Education, Trevor S. Harding and Cynthia J. Finelli
Fatigue Thresholds of Cracks Resulting from Impact Damage to γ-TiAl, Trevor S. Harding and J. Wayne Jones
Integrating Manufacturing, Design and Teamwork into a Materials and Process Selection Course, Trevor S. Harding, G. Y. Lai, B. L. Tuttle, and C. V. White
The Effect of Alloying on the Properties of (Nb, Ti)Cr2 C15 Laves Phases, Dan J. Thoma, K. A. Nibur, Katherine C. Chen, J. C. Cooley, L. B. Dauelsberg, W. L. Hults, and Paul G. Kotula
Submissions from 2001
HfCo2 Laves Phase Intermetallics - Part II: Elastic and Mechanical Properties as a Function of Composition, Katherine C. Chen, Fuming Chu, Paul G. Kotula, and Dan Thoma
HfCo2 Laves Phas Intermetallics - part I: Solubility Limits and Defect Mechanisms, Katherine C. Chen, Eric J. Peterson, and Dan J. Thoma
On the Frequency and Causes of Academic Dishonesty Among Engineering Students, Trevor S. Harding
Useful Approaches to Preventing Academic Dishonesty in the Classroom, Trevor S. Harding
The Current State of Research on Academic Dishonesty Among Engineering Students, Trevor S. Harding, Donald D. Carpenter, Susan M. Montgomery, and Nicholas H. Steneck
Evaluation of a Threshold-Based Model of the Elevated-Temperature Fatique of Impact-Damaged γ-TiAl, Trevor S. Harding and J. Wayne Jones
ASEE Student Chapters: From Student Members to Faculty, Jennifer Kadlowec, Kurt DeGoede, Trevor S. Harding, and Christian Lorenz
Heat Treatment of Gamma Titanium Aluminide Alloys, Thomas J. Kelly, Michael J. Weimer, Curtiss M. Austin, Blair London, Donald E. Larson Jr., and Dean A. Wheeler
Method and Apparatus for Adaptive Process Control of Critical Dimensions During Spin Coating Process, Richard N. Savage and Emir Gurer
Plasma Deposition of Spin Chucks to Reduce Contamination of Silicon Wafers, Richard N. Savage, Emir Gurer, and Ed C. Lee
The Foundation Series on Corrosion: Integrating Science, Math, Engineering & Technology in a Lab Setting, Linda Vanasupa, Heather Smith, Blair London, Katherine C. Chen, David Niebuhr, Lanny Griffin, and Jeff Jones
Submissions from 2000
Cheating: Student Attitudes and Practical Approachs to Dealing with it, Trevor S. Harding
Effect of Foreign Object Damage on the Fatigue Strength of an XD™ γ-TiAl Alloy, Trevor S. Harding and J. Wayne Jones
The Effect of Impact Damage on the Room-Temperature Fatigue Behavior of γ-TiAl, Trevor S. Harding and J. Wayne Jones
Photoresist Coating Process Control With Solvent Vapor Sensor, Richard N. Savage, Herbert Litvak, and Emir Gurer
Implementing an Engineering Teaching Development Program for Graduate Student Instructors, Sara Soderstrom, Christian Lorenz, Michael Keinath, and Trevor S. Harding
Submissions from 1999
Training Graduate Student Instructors Effectively: The University of Michigan Model, Trevor S. Harding
Behavior of Gamma TiAl Subjected to Impact Damage and Elevated Temperature Fatigue, Trevor S. Harding and J. Wayne Jones
Room Temperature Fatique Response of γ-TiAl to Impact Damage, Trevor S. Harding, J. Wayne Jones, P. S. Steif, and T. M. Pollock
Theoretical and Experimental Investigation on the Low Temperature Properties of the NbCr2 Laves Phase, Dan J. Thoma, Chu Fuming, Katherine C. Chen, Paul G. Kotula, Terence E. Mitchell, John M. Wills, Alim Ormeci, Shao Ping Chen, and Robert C. Albers
Submissions from 1998
Factors Affecting the Room-Temperature Mechanical Properties of TiCr2-Base Laves Phase Alloys, Katherine C. Chen, Samuel M. Allen, and James D. Livingston
Microstructures and Mechanical Properties of Two-Phase Alloys Based on NbCr2, Katherine C. Chen, Paul G . Kotula, Carl M. Cady, Michael E. Mauro, and Dan J. Thoma
The Effects of Beryllium Additions on the Oxidation of Nickel Aluminide and Titanium Aluminide Based Intermetallics, R. H. Hanrahan Jr., Katherine C. Chen, and M. P. Brady
Promoting Excellence in Education with an Outstanding Student Instructor Award Program, Jennifer Kadlowec, Justin Shriver, Trevor S. Harding, and Charles Choi
Defects and Site Occupancies in Nb-Cr-Ti C15 Laves Phase Alloys, P. G. Kotula, C. B. Carter, Katherine C. Chen, Dan J. Thoma, F. Chu, and T. E. Mitchell
Submissions from 1997
Formation of a Metastable BCC Solid Solution and Decomposition to a C15 Laves Phase in Melt-Spun CrNb10Ti10, Katherine C. Chen, P. G. Kotula, F. Chu, and Dan J. Thoma
Orientation Relationships in the System Nb-NbCr2, P. G. Kotula, Katherine C. Chen, Dan J. Thoma, F. Chu, and T. E. Mitchell
Submissions from 1996
Assessment of the Compositional Influences on the Toughness of TiCr2-Base Laves Phase Alloys, Katherine C. Chen, Samuel M. Allen, and James D. Livingston
Submissions from 1995
Evidence of Heterogeneous Substructure Development During Primary Creep of Ti-6Al-2Sn-4Zr-2Mo, R. W. Hayes, Cecil Rhodes, and Blair London
Submissions from 1992
Morphology, Deformation, and Defect Structures of TiCr2 in Ti-Cr Alloys, Katherine C. Chen, Samuel M. Allen, and James D. Livingston
On the Creep Deformation of a Cast Near Gamma TiAl Alloy Ti-48Al-1Nb, R. W. Hayes and B. London
Application of Optical Emission Diagnostics and Control Related to Semiconductor Processing, Richard N. Savage and Greg C. Viloria
Steady-State Creep Deformation of Investment Cast Near-Gamma Titanium Aluminide, D. A. Wheeler, B. London, and D. E. Larsen Jr.
Submissions from 1991
Apparatus and Method for Automatically Identifying Chemical Species Within a Plasma Reactor Environment, Richard N. Savage
In-Situ Film Thickness Measurements for Real-Time Monitoring and Control of Advanced Photoresist Track Coating Systems, Richard N. Savage, Thomas E. Metz, and Horace O. Simmons
Submissions from 1990
Optical Switch, Richard N. Savage
In-Line Photoresist Thickness Monitor, Richard N. Savage, Tom W. Batchelder, Kenneth M. Sautter, and Gary H. Memovich
Real-Time, In-Situ Measurement of Film Thickness and Uniformity During Plasma Ashing of Photoresist, Richard N. Savage, Horace Simmons, John T. Davies, and Thomas Metz
Submissions from 1985
New Specimen Design for Studying the Growth of Small Fatigue Cracks with Surface Acoustic Waves, Blair London
Applications of Optical Emission Spectroscopy to Semiconductor Processing, Richard N. Savage, John G. Shabushnig, and Paul R. Demko
Submissions from 1982
Metal Cation/Anion Speciation Via Paired-Ion, Reversed Phase HPLC With Refractive Index and/or Inductively Coupled Plasma Emission Spectroscopic Detection Methods, Richard N. Savage; D. Bushee; I. S. Krull; and S. B. Smith, Jr.
Speciation of Cr (III) and Cr (VI) Via Reversed Phase HPLC With Inductively Coupled Plasma Emission Spectroscopic Detection (HPLC-ICP)24, Richard N. Savage; I. S. Krull; D. Bushee; R. G. Schleicher; and S. B. Smith, Jr.
Submissions from 1981
Characteristics of the Background Emission Spectrum From a Miniature Inductively-Coupled Plasma, Richard N. Savage and G. M. Hieftje
Development and Characterization of a 9-mm Inductively-Coupled Argon Plasma Source for Atomic Emission Spectrometry, A. D. Weiss, Richard N. Savage, and G. M. Hieftje
Submissions from 1978
Enhancement of Pneumatic Nebulization Efficiency Through Application of an Electric Field, Richard N. Savage and G. M. Hieftje
