Recommended Citation
Postprint version. Published in Microelectronics Reliability, Volume 65, August 13, 2016, pages 173-177.
The definitive version is available at https://doi.org/10.1016/j.microrel.2016.08.006.
Abstract
Brittle solder joints in Electroless Ni electroless Pd immersion Au (ENEPIG) surface finishes are one of the key reliability issues in electronics assembly. Previous characterization of the reflow process has indicated that interfacial voids formed after solder reflow are responsible for the decreases in solder joint strength. However, the mechanisms behind the formation of these voids in the ENEPIG process remain unclear. In this paper, the interaction between various aspects of the ENEPIG process and solder joint strength were investigated. Surface roughness, morphology, and nano-pitting at the interface between electroless Pd and Ni-P were characterized. The size and density of nano voids inside Ni2SnP were measured after the specimens were reflowed with Sn4Ag0·5Cu solder ball. Additionally, high speed shear solder joint strength measurements were made. The results indicated that anion adhesion induced nano-pitting at the interface between the Ni2SnP intermetallic and Pd, resulting in the formation of a nano void layer during reflow. These interfacial voids lead to lower solder joint strength. Based on the results, a solution to prevent the brittle solder joint failures is suggested.
Disciplines
Industrial Engineering | Manufacturing
Copyright
2016 Elsevier
Number of Pages
5
URL: https://digitalcommons.calpoly.edu/ime_fac/103