Relative Intensity Noise Study in the Injection-Locked Integrated Electroabsorption Modulator-Lasers
Recommended Citation
Presented at the Internatioal Semiconductor Device Research Symposium (ISDRS 2007): College Park, MD, December 12, 2007.
The definitive version is available at https://doi.org/10.1109/ISDRS.2007.4422352.
Disciplines
Electrical and Computer Engineering
Copyright
2007 IEEE.
Number of Pages
2
Publisher statement
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URL: https://digitalcommons.calpoly.edu/eeng_fac/30