Published in Conference on Lasers and Electro-Optics 2003 Technical Digest (CLEO), January 1, 2003.
NOTE: At the time of publication, the author Glen Gillen was not yet affiliated with Cal Poly.
The definitive version is available at https://doi.org/10.1364/AO.43.002054.
We have developed and tested a novel application of interferometry to determine the absolute refractive index of individual infrared materials having flat and parallel surfaces without alteration of the sample in any way, and measured no for ZnGeP2.
This paper was published in Conference on Lasers and Electro-Optics 2003 Technical Digest (CLEO) and is made available as an electronic reprint with the permission of OSA. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.