Published in Applied Optics, Volume 43, Issue 10, January 1, 2004, pages 2054-2058.
NOTE: At the time of publication, the author Glen Gillen was not yet affiliated with Cal Poly.
The definitive version is available at https://doi.org/10.1364/AO.43.002054.
A method to determine the absolute refractive index of materials available in the shape of flat wafers with parallel sides by using interferometric techniques is presented. With this method, nondestructive, sample-specific measurements can be made. The method is tested by using silicon, germanium and zinc selenide, and measurements for both the ordinary and extraordinary axes of ZnGeP2 for temperatures of 300 and 77 K are reported.
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