Published in Applied Optics, Volume 44, Issue 3, January 25, 2005, pages 344-347.
NOTE: At the time of publication, the author Glen Gillen was not yet affiliated with Cal Poly.
The definitive version is available at https://doi.org/10.1364/AO.44.000344.
We present a method to independently measure the refractive index and the thickness of materials having flat and parallel sides by using a combination of Michelson and Fabry-Perot interferometry techniques. The method has been used to determine refractive-index values in the infrared with uncertainties in the third decimal place and thicknesses accurate to within ± 5 µm for materials at room and cryogenic temperatures.
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