Applied Optics, Volume 47, Issue 2, January 7, 2008, pages 164-168.
The definitive version is available at https://doi.org/10.1364/AO.47.0001644.
An experimental method is introduced to measure the refractive index and its temperature dependence for wafer-shaped infrared materials over a continuous temperature range. Using a combination of Michelson interferometry, Fabry-Perot interferometry, and a temperature-controlled cryostat in a laser micrometer, refractive index values and their temperature coefficients can be measured for any specific temperature within a desired temperature range. Measurements are reported for InAs and InSb for a laser wavelength of 10.59 μm.
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