Postprint version. Published in Applied Physics Letters, Volume 65, Issue 2, July 11, 1994, pages 219-221.
NOTE: At the time of publication, the author David Braun was not yet affiliated with Cal Poly.
The definitive version is available at https://doi.org/10.1063/1.112678.
We report the observation of the Schottky effect at the interface between a metal and a semiconducting polymer by means of internal photoemission spectroscopy. The bias dependence of the barrier provides information on the electrical properties of the polymer.
Electrical and Computer Engineering
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