United States Patent Number: 8,004,564, August 23, 2011.
Systems and methods are disclosed herein to provide automated testing on infrared image data to detect image quality defects. For example, in accordance with an embodiment of the present invention, image processing algorithms are disclosed to generate an image quality metric that may be compared to one or more thresholds to perform an automated test for image quality defects. For example, the image quality metric may be compared to two thresholds to determine if the corresponding infrared sensor or infrared camera is defective or not due to image quality or requires further manual inspection by test personnel.
Statistics and Probability
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