Published in Conference on Lasers and Electro-Optics 2003 Technical Digest (CLEO), January 1, 2003.
Copyright © 2003 Optical Society of America. This paper was published in Conference on Lasers and Electro-Optics 2003 Technical Digest (CLEO) and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/AO.43.002054. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
NOTE: At the time of publication, the author Glen Gillen was not yet affiliated with Cal Poly.
We have developed and tested a novel application of interferometry to determine the absolute refractive index of individual infrared materials having flat and parallel surfaces without alteration of the sample in any way, and measured no for ZnGeP2.