Abstract

We present a method to independently measure the refractive index and the thickness of materials having flat and parallel sides by using a combination of Michelson and Fabry-Perot interferometry techniques. The method has been used to determine refractive-index values in the infrared with uncertainties in the third decimal place and thicknesses accurate to within ± 5 µm for materials at room and cryogenic temperatures.

Disciplines

Physics

 

URL: http://digitalcommons.calpoly.edu/phy_fac/250