Purpose –The purpose of this work is to study the effect of the reflow peak temperature and time above liquidus on both SnPb and SnAgCu solder joint shear strength.

Design/methodology/approach –Nine reflow profiles for Sn3.0Ag0.5Cu and nine reflow profiles for Sn37Pb have been developed with three levels of peak temperature (230°C, 240°C, and 250°C for Sn3.0Ag0.5Cu; and 195°C, 205°C, and 215°C for Sn37Pb) and three levels of time above solder liquidus temperature (30, 60, and 90 s). The shear force data of four different sizes of chip resistors (1206, 0805, 0603, and 0402) are compared across the different profiles. The shear forces for the resistors were measured after assembly. The fracture interfaces were inspected using scanning electron microscopy with energy dispersive spectroscopy in order to determine the failure mode and failure surface morphology.

Findings –The results show that the effects of the peak temperature and the time above solder liquidus temperature are not consistent between different component sizes and between Sn37Pb and Sn3.0Ag0.5Cu solder. The shear force of SnPb solder joints is higher than that of Sn3.0Ag0.5Cu solder joints because the wetting of SnPb is better than that of SnAgCu.

Research limitations/implications –This study finds that fracture occurred partially in the termination metallization and partially in the bulk solder joint. To eliminate the effect of the termination metallization, future research is recommended to conduct the same study on solder joints without component attachment.

Practical implications –The shear strength of both SnPb and SnAgCu solder joints is equal to or higher than that of the termination metallization for the components tested.

Originality/value – Fracture was observed to occur partially in the termination metallization (Ag layer) and partially in the bulk solder joint. Therefore, it is essential to inspect the fracture interfaces when comparing solder joint shear strength.


Industrial Engineering | Manufacturing



URL: http://digitalcommons.calpoly.edu/ime_fac/28