Recommended Citation
Postprint version. Published in Applied Physics Letters, Volume 65, Issue 2, July 11, 1994, pages 219-221.
NOTE: At the time of publication, the author David Braun was not yet affiliated with Cal Poly.
The definitive version is available at https://doi.org/10.1063/1.112678.
Abstract
We report the observation of the Schottky effect at the interface between a metal and a semiconducting polymer by means of internal photoemission spectroscopy. The bias dependence of the barrier provides information on the electrical properties of the polymer.
Disciplines
Electrical and Computer Engineering
Copyright
Publisher statement
This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters
URL: https://digitalcommons.calpoly.edu/eeng_fac/56