Abstract

We report the observation of the Schottky effect at the interface between a metal and a semiconducting polymer by means of internal photoemission spectroscopy. The bias dependence of the barrier provides information on the electrical properties of the polymer.

Disciplines

Electrical and Computer Engineering

Publisher statement

This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters

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URL: http://digitalcommons.calpoly.edu/eeng_fac/56