Postprint version. Published in Applied Physics Letters, Volume 65, Issue 2, July 11, 1994, pages 219-221.
Copyright © 1994 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters and may be found at http://dx.doi.org/10.1063/1.112678.
NOTE: At the time of publication, the author David Braun was not yet affiliated with Cal Poly.
We report the observation of the Schottky effect at the interface between a metal and a semiconducting polymer by means of internal photoemission spectroscopy. The bias dependence of the barrier provides information on the electrical properties of the polymer.
Electrical and Computer Engineering